Announced details
The substrate is rotated 360 degrees, and at least 3 angles suitable for analysis are selected. X-rays are focused onto microscopic regions on the order of 50 micrometres.
The company continues to grow together with customers in 136 countries and regions (whether this is a point-in-time figure or cumulative is Not disclosed).
The Japan Institute of Invention and Innovation sponsored the awards, and inventions by Rigaku Corporation, a group company of Rigaku Holdings Corporation, received the awards. Capital and personnel relationships are Not disclosed.
A public interest incorporated association that conducts the Regional Invention Awards sponsored by the Japan Institute of Invention and Innovation. Other details, including its location, representative, capital and year established, are Not disclosed.
FY2026 Regional Invention Awards, Osaka Governor's Award (Special Award)
Kanto Regional Invention Awards, Invention Encouragement Award
Japan Institute of Invention and Innovation
Patent No. 4914514
Patent No. 6864888
Akishima, Tokyo (Rigaku Corporation headquarters)
The impact of the awards on revenue and profit is Not disclosed. The company explains that the technologies contribute to semiconductor quality control, quality stabilization and improved yields.
The company does not address Contract Value / Offering price.
FY2026 Regional Invention Awards sponsored by the Japan Institute of Invention and Innovation
| Item | Details |
|---|---|
| Names of Products / Services Covered | X-ray fluorescence semiconductor analyzer, In-line X-ray inspection system for semiconductor thin films, WDA3650, WaferX 310, XTRAIA XD-3300 |
| Counterparty | Japan Institute of Invention and Innovation |
| Counterparty overview | A public interest incorporated association that conducts the Regional Invention Awards sponsored by the Japan Institute of Invention and Innovation. Other details, including its location, representative, capital and year established, are Not disclosed. |
| Relationship with the Company | The Japan Institute of Invention and Innovation sponsored the awards, and inventions by Rigaku Corporation, a group company of Rigaku Holdings Corporation, received the awards. Capital and personnel relationships are Not disclosed. |
| Applicable area | Semiconductor quality control, Manufacturing processes for advanced semiconductors, Industrial and research analysis, Electronic materials, Battery, Environment and Energy, Life Sciences |
| Award/certification name | FY2026 Regional Invention Awards, Osaka Governor's Award (Special Award), Kanto Regional Invention Awards, Invention Encouragement Award |
| Awarding / certifying body | Japan Institute of Invention and Innovation |
| Registration number and expiry date | Patent No. 4914514, Patent No. 6864888 |
| Location | Akishima, Tokyo (Rigaku Corporation headquarters) |
| Location scale | More than 2,000 employees worldwide, customers in 136 countries and regions, and overseas sales of approximately 70% |
| Quantitative Effects | The substrate is rotated 360 degrees, and at least 3 angles suitable for analysis are selected. X-rays are focused onto microscopic regions on the order of 50 micrometres. |
| Usage history | The company continues to grow together with customers in 136 countries and regions (whether this is a point-in-time figure or cumulative is Not disclosed). |
| Impact on Business Performance | The impact of the awards on revenue and profit is Not disclosed. The company explains that the technologies contribute to semiconductor quality control, quality stabilization and improved yields. |
| Source | FY2026 Regional Invention Awards sponsored by the Japan Institute of Invention and Innovation |
Items this document does not state (4)
These are items the company does not state in this document. We do not leave them blank, nor fill them in from other sources or by inference.
The reasons the company gives
The company's own explanation, not something inferred from the numbers.The company explains that the award-winning technologies accurately analyze and evaluate the thickness and component concentrations, composition and crystallinity of thin films on semiconductor substrates, contributing to semiconductor quality control, quality stabilization and improved yields. The awards were presented in recognition at the Regional Invention Awards sponsored by the Japan Institute of Invention and Innovation.